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Device Characterization
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Load Pull is a measurement technique in which the Load
(or Source) impedance is modified using a tuner. A load
pull setup using Focus tuners ensures full and accurate
characterization of packaged and on-wafer chip transistors
from 0.03 to 110 GHz as well as internal impedances as
low as 0.1 Ohm in fixture using appropriate transformers
or 1.9 Ohm on wafer using low loss probes and bend-lines
in S and C band. Focus tuners have been used to
characterize transistors up to 400W CW and kW range
pulsed power. Focus’ device characterization software
incorporates all common and user-defined DC and RF
parameters including Gain, Power, IMD, ACPR, EVM, PAE,
Droop, etc., under CW and pulsed RF conditions |
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Harmonic load pull is supported using Focus’ patented Harmonic Rejection or Multi-Purpose tuners, as well as
the traditional Triplexer method.
Vibration-free load pull is essential for on-wafer testing and is made possible using Focus’ integrated
anti-
vibration balance kit in conjunction with iTuner’s acceleration/deceleration capability as well as the Multi-Purpose
Tuner’s (MPT) vertical-only mode of operation.
Differential load pull allows testing of push-pull transistors and on-wafer differential amplifiers. |
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계측장비 
RF Measurementt
